nvme-device-self-test-log · shipping · also NVMe self-test log, NVMe log page 06h

NVMe Device Self-test log

The NVMe Device Self-test log is log page 06h, which reports current operation progress and twenty slots for results of completed or aborted self-test operations.

Base 2.3 Figures 215-216 place the newest completed or aborted result first. Result 0h indicates completion without detected error; 6h and 7h indicate completed tests with failed segments, 5h an incomplete fatal or unknown test error, and Fh an empty slot. Abort codes are not passes. Current operation 0h means idle, not success, and the progress percentage is then ignored. Diagnostic NSID, failing-LBA, status-code type and status-code fields require their respective validity bits; Segment Number is meaningful for result 7h. The result NSID identifies a failure location rather than all namespaces tested. [1] Retrieve results separately after initiating a test; successful submission alone is insufficient. [3]

Relations

related

nvme-device-self-test, nvme-smart-log, nvme-error-information-log-entries

Limitations

• This is bounded result retention, not a lifetime fault history; invalid diagnostic fields must not be treated as zero observations. [1]

Citations

1. NVM Express Base 2.3: sections 5.2.5, 5.2.12.1.7 and 8.1.8; Figures 174-177, 215-216 and 328 (accessed 2026-10-15)
2. nvme-cli v2.13: device_self_test and wait_self_test implementation (accessed 2026-10-15)
3. nvme-cli v2.13: Device Self-test command, result retrieval and SIGINT behavior (accessed 2026-10-15)
4. Hesela: NVMe self-test scope, result validity and diagnostic boundaries (accessed 2026-10-15)

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