Thermal writability
Thermal writability is the requirement that a magnetic write field bias the intended state strongly enough relative to thermal fluctuations to meet a recording-error target.
Evans and colleagues distinguish this from merely overcoming coercivity [1]. Their equilibrium, aligned-axis model describes a single grain per bit; numerical density estimates depend on write field, temperature, magnetization and error tolerance. They are not universal commercial-HAMR limits. This concerns errors during writing, not only retention after cooling.
Relations
- related
- hamr, superparamagnetic-limit, near-field-transducer