NAND program interference
NAND program interference is an unintended shift in a cell's threshold voltage caused by programming neighboring cells.
This differs from page pairing (shared cells), read disturb (read-induced effects) and retention loss (time-dependent degradation). In the HPCA 2017 experiments, capacitive coupling affected partially programmed planar MLC cells.
Relations
- related
- nand-page-pairing, mlc, read-disturb, data-retention
Limitations
- The chip generation and internal programming path constrain the result; controller ECC does not automatically cover every internal reread. [1]