Spin-transfer-torque MRAM
STT-MRAM is MRAM that uses spin-polarized current through a magnetic tunnel junction to switch the magnetization of its free layer.
Switching: The direction of current through the junction selects the intended magnetic state. This differs from field-switched Toggle MRAM. [2] [1]
Reliability: Pulsed electrical stress can degrade the tunnel barrier. Measurements on MgAl2O4 junctions found breakdown depended on pulse polarity and interface conditions. These results do not specify a commercial device's endurance. [4]
Completion: EM128LX v1.7 may report WIP after CS# rises; reset can interrupt writes and corrupt data. [3]
Relations
- related
- Magnetoresistive RAM, Magnetic tunnel junction, Persistent memory, Magnetic thermal stability factor
Citations
- Everspin: Toggle MRAM Technology, cell structure and read/write operation.
- Everspin: STT-MRAM Technology, switching mechanism and interface examples.
- Everspin EM128LX datasheet v1.7 (2025), sections 9, 18.1 and 22.6, Table 31.
- Choi et al. (2017). Endurance of magnetic tunnel junctions under dynamic voltage stress. Electronics Letters 53:1146-1148.